(Download) "Bias Temperature Instability for Devices and Circuits" by Tibor Grasser ~ eBook PDF Kindle ePub Free

eBook details

Title: Bias Temperature Instability for Devices and Circuits
Author : Tibor Grasser
Release Date : January 22, 2013
Genre: Electrical Engineering,Books,Professional & Technical,Engineering,
Pages : * pages
Size : 19239 KB

Description

This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, compact modeling with RC ladders and implications on device reliability and lifetime.

·         Enables readers to understand and model negative bias temperature instability, with an emphasis on dynamics;

·         Includes coverage of DC vs. AC stress, duty factor dependence and bias dependence;

·         Explains time dependent defect spectroscopy, as a measurement method that operates on nanoscale MOSFETs;

·         Introduces new defect model for metastable defect states, nonradiative multiphonon theory and stochastic behavior.